Structural and Optical Properties of Varies Thickness of Znte Nanoparticle
ZnTe thin films of different thicknesses were deposited onto glass substrates for optical devices applications. Xray diffractogram of different thicknesses for ZnTe films are measured and their patterns exhibits polycrystalline nature with a preferential orientation along the (111) plane. X-ray diffraction techniques have been employed to determine the microstructure parameters, both crystallite size and microstrain. Film thickness and the optical constants of ZnTe films were calculated based on the measured transmittance spectral data using Swanepole’s method in the wavelength range 400–2500 nm. The refractive index n and absorption index k were calculated and the refractive index exhibits a normal dispersion. The refractive index could be extrapolated by Cauchy dispersion relationship over the whole spectra range, which extended from 400 to 2500 nm. The optical band gap can be calculated in strong absorption region and displays an allowed direct transition. Both the refractive index and the band gap increase with the increase film thickness, thus ZnTe/glass substrates are good candidates in optoelectronic devices.
Keywords: ZnTe, thin film, cry crystallitze size; microstrain; optical constants.
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